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Focussed Ion Beam (FIB)
Focussed Ion Beam is a similar technique to the SEM, with the exception that a beam of excited ions are used instead of the conventional electron beam. The ion beam
can be used to vaporise material from the sample surface and is capable of 'micro-machining' trenches, troughs and remove layers etc. To reveal sections or surfaces of
interest for imaging and EBSD examination. In the case of dual beam instruments that have the capability of focussing both ion and electron beams onto the same
region of the sample, the prospect of sample preparation in-situ and under vacuum becomes a reality. Certain materials are reactive or oxidise easily which makes preparation by conventional methods impossible. FIB also creates the possibility of preparing materials that are too soft for conventional preparation.